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1 article(s) from Ritz, Christian

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

Christian Ritz,
Tino Wagner and
Andreas Stemmer

Beilstein J. Nanotechnol. 2020, 11, 911–921, doi:10.3762/bjnano.11.76

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Figure 1: A modulation of the tip–sample bias U_ts leads to a response in the frequency shift Δf. The time-res...

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Figure 2: Design and operation of the time-domain KFM controller. (a) Underlying system model. (b) Measuremen...

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Figure 3: Open-loop TD-KFM of a few-layer graphene flake. (a) Topography, (b) estimated topography-induced fr...

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Figure 4: Comparison of standard single-scan FM-KFM and closed-loop TD-KFM of two overlapping graphene flakes...

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Figure 5: (a) Cross sections of the topography along the sections indicated in Figure 4 for single-scan FM-KFM (feedb...

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Published 15 Jun 2020

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